XRF spectrometers
Energy- and wavelength-dispersive XRF systems for elemental analysis, coatings, precious metals, RoHS and field applications.
Products in this category
EXPLORER 5000
New-generation handheld XRF alloy analyzer — non-destructive material-grade identification in about a second, a library of 500+ alloy grades and performance close to benchtop instruments.
- Handheld and lightweight; 270° rotatable 5-inch HD touchscreen
- Library of 500+ alloy grades; grade identification in about 1 s
- Alloy, stainless and tool steels and Ni, Co, Ti, Cu, Zn, W alloys
- Non-destructive positive material identification (PMI) and production QC
EDX6000C
New-generation energy-dispersive XRF (EDXRF) spectrometer with a graphene-window SDD detector — elemental analysis down to fluorine, single- and multi-cup modes, and automated RoHS software.
- Electrically cooled SDD detector with a large-area, ultra-thin graphene window
- Element range extended down to fluorine (F); detection limit to 0.2 ppm in light matrices
- Count rate up to 300 KCPS with 4096-channel processing
- PLC multi-cup chamber (9 / 12 / 20 positions) with auto-rotation for unattended batches
SMART 100 PLUS
Benchtop XRF precious-metal tester with a FAST-SDD detector — a result in 1 second, a 2D moving stage and point, multi-point and grid measurement modes; distinguishes 99.9% and 99.99% gold.
- FAST-SDD detector (125 eV, 25 mm²) — a result in 1 second, over 300 kCPS
- Distinguishes 99.9% and 99.99% gold purity (high-purity gold curve)
- 2D stage — point, multi-point and grid modes with live preview
- Measurement of very small samples — collimator from 0.2 mm
EXPLORER 7000
Handheld XRF analyzer for ores and geological samples — with digital multichannel processing, built-in GPS and an HD camera for fast on-site elemental assessment.
- Handheld, lightweight, water- and dust-proof for harsh field use
- Digital multichannel processor — low detection limits, benchtop-class performance
- Built-in GPS — records coordinates, maps deposits and defines boundaries
- 270° rotatable 5-inch HD touchscreen and Bluetooth printing
EDX 5500H
EDXRF analyzer for elemental mud logging of drill cuttings — fast determination of rock composition and lithology identification in the field and the lab.
- Lithology identification from the elemental composition of cuttings
- Vacuum chamber and a FAST-SDD detector — very low detection limits
- 4096-channel digital technology and an ultra-thin beryllium-window tube
- Anti-vibration design — mobile (vehicle-mounted) and laboratory measurement
EXPLORER 9000
Handheld XRF analyzer for heavy metals in soil — in-situ measurement of contaminants (Hg, Cd, Pb, As, Cu, Zn, Ni and more) with GPS for mapping and remediation support.
- Heavy metals in soil: Hg, Cd, Pb, As, Cu, Zn, Ni, Co, V, Cr, Mn
- In-situ measurement for surveys, emergency response and remediation monitoring
- Built-in GPS — pollution mapping and boundary definition
- Handheld, lightweight, water- and dust-proof
SEE100
Benchtop EDXRF spectrometer for heavy metals in soil — in-situ and screening measurement of 15 elements (Hg, Cd, Pb, As, Cu, Zn, Ni, Co, V and more), with an optional autosampler and a vehicle-mounted version.
- 15 heavy metals in soil: Hg, Cd, Pb, As, Cu, Zn, Ni, Co, V
- Solid, liquid and powder samples — soil, rock, slag, slurry
- High sensitivity and low detection limits (original imported detector)
- Optional autosampler — mass screening of contaminated samples
EXPLORER 3000
Handheld (portable) XRF harmful-element analyzer — designed for RoHS, for testing electronics, toys, packaging, batteries and large parts without taking a sample.
- Handheld and lightweight — performance close to benchtop instruments
- Digital multichannel technology — lower detection limits and high stability
- Tests large parts directly on the surface, without cutting
- Applications: RoHS, toys, packaging materials, batteries
EDX 3200S PLUS C
Rapid XRF analyzer for heavy metals in food — non-destructive determination of cadmium, lead, chromium, arsenic and selenium in grain, with an autosampler and a three-color result indicator.
- Heavy metals in food: Cd, Pb, Cr, As, Se
- Screening in 3 min, accurate quantification in 10 min — no reagents
- National suitability validation for rice, wheat and corn (Cd, Cr, Se, Pb, As)
- Three-color result indicator (red/yellow/green)
Thick800A
Energy-dispersive XRF coating thickness analyzer with fully automatic, software-driven multi-point measurement and a high-precision positioning stage.
- Fully automatic, software-driven multi-point measurement
- High-precision XY stage with positioning repeatability under 0.005 mm
- Dual-laser positioning and a 0.1 mm diameter collimator
- FAST-SDD detector for accurate results
Cube100S PLUS
Portable XRF analyzer for fast on-site determination of sulfur in crude oil and fuels — compliant with the MARPOL convention and standards ISO 8217 and ISO 8754.
- Fast on-site determination of sulfur in fuels
- X-ray fluorescence (XRF) technique
- Compliant with the MARPOL convention for marine fuels
- Meets standards ISO 8217 and ISO 8754
EDX3600H
Professional benchtop EDXRF spectrometer for full elemental analysis (sodium to uranium) with an SDD detector — for alloys, precious metals, coatings, catalysts, geology and RoHS.
- SDD detector with 135–145 eV resolution
- Measuring range from 1 ppm to 99.99%; elements from Na to U
- Light-element optimization; air or optional vacuum atmosphere
- Built-in CCD camera with an automatic filter and collimator changer
Cube 100S
Portable energy-dispersive XRF analyzer for fast on-site determination of sulfur in fuels (diesel and bunker oils) — compliant with MARPOL and ISO 8754 requirements.
- Sulfur-in-fuel measurement in under 200 s
- Compliant with ISO 8217-2010, ISO 8754 and GB/T 17040-2008 (MARPOL)
- Embedded Windows CE — on-site operation without a computer
- Only 4.8 kg; safe enclosed sample chamber with status indication
EDX 1800B
Benchtop energy-dispersive XRF spectrometer in a down-looking design with a Si-PIN detector — reliable for RoHS, alloy, coating and precious-metal analysis.
- Down-looking design — measures samples of various shapes
- Si-PIN detector with a new-generation X-ray tube up to 50 W
- Motorized switching of collimators and filters for different modes
- Movable stage for precise positioning of the measurement point
EDX 1800E
Benchtop XRF spectrometer (down-looking) with a FAST-SDD detector — detects up to 75 elements down to 1 ppm, for RoHS, alloy, coating and precious-metal analysis.
- FAST-SDD detector; detects up to 75 elements down to 1 ppm
- Repeatability and stability at the 0.05% level
- Down-looking design, up to 50 W tube, motorized collimators and filters
- Safety: lid-closure self-check and an emergency high-voltage lock
EDX 2000A
Automatic micro-area XRF coating-thickness tester with a FAST-SDD detector — non-contact measurement of coatings on flat and complex shapes, for semiconductors, ICs and PCBs.
- FAST-SDD detector with up to 129 eV resolution — analysis of multilayer coatings
- Automatic X, Y, Z motion and dual-laser positioning
- Up-looking design — measurement of small, irregularly shaped samples
- Variable-focus camera with a distance-compensation system
EDX 2000H
Benchtop XRF (EDXRF) analyzer for brass and other metal alloys — down-looking design with a Si-PIN detector, with element coverage expandable without hardware changes.
- Brass composition plus copper, zinc, cobalt alloys and stainless steel
- Down-looking design — measurement of variously shaped samples
- New-generation tube and high-voltage supply — higher throughput
- Expand element and alloy coverage without adding hardware
EDX 3000
Benchtop XRF (EDXRF) spectrometer with a Si-PIN detector for precious metals — accurate analysis of gold, silver, platinum, palladium, copper, zinc and nickel in jewelry.
- Si-PIN detector — analysis of Au, Ag, Pt, Pd, Cu, Zn, Ni in jewelry
- Semiconductor electric cooling — no liquid nitrogen
- Built-in HD camera for sample observation
- Digital pulse processor — fast, accurate data processing
EDX 3000B
Benchtop XRF (EDXRF) spectrometer with a Si-PIN detector for precious metals — accurate analysis of gold, silver, platinum, palladium and other metals in jewelry.
- Si-PIN detector — superior to proportional counters; analyzes Au, Ag, Pt, Pd, Cu, Zn, Ni
- Long-life, stable X-ray tube
- Semiconductor electric cooling — no liquid nitrogen
- Built-in HD camera for sample observation
EDX 3000PLUS
Energy-dispersive XRF spectrometer for precise precious-metal analysis (Au, Ag, Pt, Pd) — a large-area 25 mm² FAST-SDD detector and resolution down to 125 eV.
- Large-area 25 mm² FAST-SDD detector with resolution down to 125 eV
- Count rate up to 80,000 — 5–10× more than a 6 mm² Si-PIN detector
- Accurate analysis of Au, Ag, Pt, Pd, Cu, Zn, Ni in jewelry
- Compliant with the GB/T 18043-2000 standard
EDX 3000SE
Benchtop XRF (EDXRF) spectrometer with a Si-PIN detector for precious metals — vertical optics and a small collimator detect rhenium (Re) and tungsten (W) adulterants in gold.
- Si-PIN detector — analysis of Au, Ag, Pt, Pd, Cu, Zn, Ni in jewelry
- Vertical optics and a small collimator — detection of Re and W adulterants in gold
- Extra-large chamber for samples of various sizes
- FP method — full one-button measurement
EDX 3200S PLUS
Integrated XRF analyzer for sulfur in petroleum products (gasoline, diesel, lubricants) — with a vacuum system and a built-in computer, for the lab and the production line.
- Sulfur in fuels and oils; compliant with GB252-2015, GB/T17040-2008 and ASTM D7039
- Vacuum system — no helium, lower analysis cost
- Down-looking design protects the tube and detector window with light oils
- FAST-SDD detector and a high-efficiency high-power side-window tube
EDX 3300S
Portable wavelength-dispersive (WDXRF) sulfur-in-fuel analyzer — a 0.5 mg/kg detection limit, compliant with ASTM D7039 and road and marine fuel standards.
- Double-curved-crystal monochromator — selective excitation and low background
- Low detection limit of 0.5 mg/kg; RSD under 5% at 10 mg/kg
- Compliant with ASTM D7039, GB252-2015 and GB17411-2015 (marine fuel)
- Portable and light; no vacuum, no consumables and no sample prep
EDX 3600
Energy-dispersive XRF spectrometer with a FAST-SDD detector and an optional vacuum system — accurate, non-destructive analysis of precious metals and light elements in jewelry.
- FAST-SDD detector with resolution down to 125 eV
- Optional vacuum chamber for light-element analysis
- Determination of Au, Ag, Pt, Pd, Rh, Cu, Fe, Ni, Zn, Ir and more
- Compliant with the GB-1887 and GB/T-18043 standards
EDX 3800
Versatile benchtop EDXRF spectrometer with an electrically cooled semiconductor detector and a high-power source — for RoHS, alloy, coating and precious-metal analysis, with an optional autosampler arm.
- High-performance, electrically cooled semiconductor detector
- High-power excitation source — lower detection limits for heavy elements (5–10×)
- Independent cooling channel maintains stability at high power
- All-in-one design and one-button measurement
EDX 4500
Benchtop EDXRF spectrometer with a FAST-SDD detector and a smart vacuum system — for steel testing, full-element analysis and harmful-element detection (RoHS, halogens).
- Ultra-thin-window X-ray tube at an internationally advanced level
- Digital multichannel technology — count rate up to 100,000 CPS
- FAST-SDD detector with good linearity and energy resolution
- Smart vacuum system — efficient excitation of light elements (Si, P)
EDX 4500A
Benchtop EDXRF spectrometer with a smart vacuum system and an optional 23-position autosampler — for quality control in mining, metallurgy and inorganic-materials production.
- Smart vacuum system — excitation of light elements (Na, Mg, Al, Si, P, S, Cl)
- Precise analysis of elements: K, Ca, Ti, V, Cr, Mn, Fe, Ni, Mo, Zr, Ba
- Optional 23-position arm — high-throughput, unattended measurement
- One-button measurement after loading samples
EDX 4500H
Benchtop EDXRF spectrometer with a FAST-SDD detector and a smart vacuum system — fast, non-destructive analysis for smelting process control, alloy analysis and full-element analysis.
- Smart vacuum system — excitation of light elements (Si, P, S, Al, Mg)
- Precise analysis of high-content elements (Cr, Ni, Mo)
- Short measurement time — real-time smelting process control
- Digital multichannel technology — up to 100,000 CPS
EDX 600
Energy-dispersive XRF spectrometer for precious-metal composition analysis — a proportional-counter detector, complete analytical software and simple, cost-effective measurement.
- Proportional-counter detector — cost-effective, efficient precious-metal analysis
- Intelligent software for gold and jewelry-alloy analysis
- Multiple selectable analysis and identification models
- Independent matrix-effect correction models
EDX 600 PLUS
Down-looking energy-dispersive XRF coating thickness analyzer — no liquid nitrogen and no sample prep, for inspecting electroplated, electroless and hot-dip coatings.
- Down-looking design with one-button measurement for fast sample placement
- Works without liquid nitrogen and without sample preparation
- Micro-focus source and small collimators (down to 0.1 × 0.3 mm) for tiny spots
- Variable-focus camera with distance compensation for irregular surfaces
EDX 680
Benchtop XRF (EDXRF) spectrometer with a Si-PIN detector for precious metals — a gold-content tester with a clear HD sample-observation system.
- Si-PIN detector and an efficient excitation source — precious-metal composition control
- Tube: 50–1000 µA current, 5–50 kV high voltage
- Unique collimator and filter system
- Digital multichannel analyzer and HD sample-observation system
EDX 6800
Benchtop EDXRF spectrometer with a smart vacuum system and a FAST-SDD detector — fast, accurate, non-destructive analysis of ores, alloys and full-element analysis.
- Smart vacuum system — excitation of light elements (Si, P, S, Al, Mg)
- Precise analysis of high-content elements (Cr, Ni, Mo)
- Ultra-thin-window tube at an internationally advanced level
- Latest digital multichannel technology — up to 100,000 CPS
EDX 8000L
XRF spectrometer for archaeological research — non-destructive composition analysis and support for dating and provenance of ceramics, bronzes and precious-metal objects, with a large vacuum chamber.
- Simultaneous body and glaze composition of ancient ceramics (Na2O, MgO, Al2O3, CaO, Fe2O3, K2O and more)
- Supports dating and provenance via comparison with a ceramics database
- Analysis of bronzes (Cu, Sn, Pb, Zn) and precious metals (Au, Pt, Ag, Pd and more)
- Very large vacuum chamber for objects of varying size and shape
EDX-PCB
Top-illumination XRF coating-thickness analyzer with a very large travel range — for measuring large PCB boards, enclosures and wafers, with drawing and image input.
- Very large travel range for big samples
- Measurement of large PCB boards, enclosures and wafers
- Drawing-input system and external image import
- Micro-area camera for fast point positioning
EDX-T30
Top-illumination XRF analyzer for measuring coating thickness — with a built-in multi-collimator, automatic filter switching, dual cameras and automatic 3D X/Y/Z movement.
- Top-illumination design for coating-thickness measurement
- Built-in multi-collimator and automatic filter switching
- Dual cameras — detail and a wide HD field of view
- Automatic 3D movement on X/Y/Z axes
EDX-V
XRF coating-thickness and composition analyzer with polycapillary X-ray optics — for efficient, accurate micro-area measurement of electronic parts, chip pins and wafers.
- Coating-thickness measurement and composition analysis
- Polycapillary X-ray optical system
- Micro-area measurement at the micron scale
- Electronic parts, chip pins and wafers
EDX1800B (Smart)
Energy-dispersive XRF (EDXRF) spectrometer — a refreshed "smart" edition of the trusted EDX1800B with domestic core components and a better price-performance ratio.
- Proven EDX1800B platform in a refreshed edition
- High-quality domestic core components
- New-generation detector
- Excellent performance kept at a better price-performance ratio
EDX1800BS
Energy-dispersive XRF (EDXRF) spectrometer — the EDX1800BS edition with a new high-voltage power supply and X-ray tube for higher reliability and measurement efficiency.
- New-generation high-voltage power supply and X-ray tube
- Higher reliability and a raised protection level
- Higher tube power that improves measurement efficiency
- Fast solid-waste screening
EDX600Pro
Down-looking XRF coating-thickness gauge — fast measurement of the composition and thickness of electroplated, electroless and hot-dip coatings and of metal-ion concentration in plating baths, with no liquid nitrogen or sample prep.
- Down-looking design — fast measurement without sample prep or liquid nitrogen
- High-power source and a micro-focus tube — stable signal
- Very small collimators (from 0.1 × 0.3 mm) — measurement of fine features
- Accurate analysis of multilayer and complex alloy coatings
EDXThick800
Top-illumination multifunctional XRF analyzer for automatic micro-area coating-thickness measurement — with hazardous-element detection and light-element analysis.
- Automatic micro-area coating-thickness measurement
- Multifunctional — also hazardous-element detection
- Light-element composition analysis
- Three-dimensional X/Y/Z movement system
Legend 2000
XRF precious-metal analyzer compliant with GB/T18043-2013 — with a FAST-SDD detector and a vertical optical path, it also detects rhenium and tungsten adulterants in gold.
- FAST-SDD detector; determination of Au, Ag, Pt, Pd, Cu, Zn, Ni
- Vertical optical path and a small collimator — detects Re and W adulterants in gold (Re/W alarm)
- Movable stage and HD zoom camera — precise positioning and photos in the report
- Large measurement chamber for samples of different sizes