EDX3600H
Professional benchtop EDXRF spectrometer for full elemental analysis (sodium to uranium) with an SDD detector — for alloys, precious metals, coatings, catalysts, geology and RoHS.
- SDD detector with 135–145 eV resolution
- Measuring range from 1 ppm to 99.99%; elements from Na to U
- Light-element optimization; air or optional vacuum atmosphere
- Built-in CCD camera with an automatic filter and collimator changer
- FP analytical software; analysis time 60–200 s
- Measures solids, powders and liquids
The EDX3600H is a professional benchtop energy-dispersive X-ray fluorescence (EDXRF) spectrometer for full elemental analysis. Thanks to its SDD detector and optimized measurement path, it determines elements across a wide range — from sodium (Na) to uranium (U) — and can operate in an air or vacuum atmosphere for better light-element measurement.
Applications
- Science and research, geology
- Jewelry and precious metals
- Industry, alloy and catalyst testing
- Coating inspection and RoHS
What to ask about
The standard configuration includes the main unit with an SDD detector, an optical-path optimization system, a built-in CCD camera, a filter and collimator set with an automatic changer, FP analytical software and a control computer. An optional vacuum system extends the range of measurable light elements. Contact us to match a configuration to your samples and application.
The full technical specification is available in the brochure (PDF).