WDX spectrometers

Skyray wavelength-dispersive WDX spectrometer

Wavelength-dispersive X-ray fluorescence (WDXRF) spectrometers — sequential and multi-channel — for precise elemental analysis from light to heavy elements across industry, geology and petrochemicals.

Products in this category

  • Skyray WDX-200 spectrometer

    WDX-200

    Compact multi-channel wavelength-dispersive (WDXRF) spectrometer with up to 10 fixed channels — simultaneous, fast and non-destructive analysis of up to 10 elements from Na to U.

    • Up to 10 fixed dispersing channels — 10 elements at once
    • Any 10 elements from Na to U can be configured
    • Fast, non-destructive analysis of powder and bulk samples
    • Multi-channel MCA with parallel real-time detection
  • Skyray WDX-400 spectrometer

    WDX-400

    Multi-channel wavelength-dispersive (WDXRF) spectrometer with 10 fixed channels — simultaneous analysis of 10 elements from Na to U, with liquid-sample analysis once fitted with helium purging.

    • 10 fixed channels — simultaneous analysis of 10 elements from Na to U
    • Standard configuration: Na, Mg, Al, Si, S, Cl, K, Ca, Fe and P or Ti
    • Fast, non-destructive analysis of powders, pressed pellets, glass beads and bulk
    • Digital MCA with real-time detection
  • Skyray WDX-4000 sequential spectrometer

    WDX-4000

    Sequential wavelength-dispersive X-ray fluorescence (WDXRF) spectrometer for precise elemental analysis from beryllium (Be) to uranium (U) — for geology, cement, metallurgy and environmental protection.

    • Analysis of elements from Be(4) to U(92)
    • Sequential design with a wide application range
    • Innovative goniometer with a patented steel-belt drive
    • Independent θ/2θ axes with servo drive and circular grating in a closed loop
  • Skyray WDX3300 spectrometer

    WDX3300

    Single-wavelength X-ray spectrometer with a dual bent-crystal system for light-element analysis and chlorine determination in petroleum products — with a detection limit down to 0.16 ppm.

    • Dual bent-crystal system with secondary focusing
    • Outstanding light-element detection, LOD down to 0.16 ppm
    • Peak-separation technique that eliminates adjacent-line interference
    • Fully automatic vacuum optical path

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