EDX 2000A
Automatic micro-area XRF coating-thickness tester with a FAST-SDD detector — non-contact measurement of coatings on flat and complex shapes, for semiconductors, ICs and PCBs.
- FAST-SDD detector with up to 129 eV resolution — analysis of multilayer coatings
- Automatic X, Y, Z motion and dual-laser positioning
- Up-looking design — measurement of small, irregularly shaped samples
- Variable-focus camera with a distance-compensation system
- Programmable moving stage — multi-point measurement of dense samples
- Applications: electroplating, electronics, automotive, magnetic materials
The EDX 2000A is an energy-dispersive XRF spectrometer in an automatic micro-area coating-thickness tester configuration. With automatic three-axis (X, Y, Z) motion, dual-laser positioning and a protection system, it quickly and precisely focuses on samples of simple and complex shapes — flat, concave-convex, corners and curved surfaces. It meets the need for non-contact coating-thickness measurement in the semiconductor, IC and PCB industries.
Applications
- Electroplating and precious-metal coatings
- Electronics, telecommunications, aerospace and new energy
- Fittings, home appliances and electrical equipment
- Automotive, magnetic materials, universities and research institutes
What to ask about
The up-looking design more than doubles signal-collection efficiency compared with conventional optics and lets you measure small, irregular samples — steps, deep grooves and blind holes. A programmable stage enables multi-point measurement of densely arranged features. Contact us to match a configuration to your coatings.
The full technical specification and configuration will be provided in the datasheet PDF.