EDX 4500H
Benchtop EDXRF spectrometer with a FAST-SDD detector and a smart vacuum system — fast, non-destructive analysis for smelting process control, alloy analysis and full-element analysis.
- Smart vacuum system — excitation of light elements (Si, P, S, Al, Mg)
- Precise analysis of high-content elements (Cr, Ni, Mo)
- Short measurement time — real-time smelting process control
- Digital multichannel technology — up to 100,000 CPS
- FAST-SDD detector and automatic spectrum stabilization
- Applications: alloys, full-element, harmful elements (RoHS, halogens)
The EDX 4500H is a benchtop XRF spectrometer that uses X-ray fluorescence for fast, accurate and non-destructive elemental-composition analysis. A smart vacuum system efficiently excites light elements (Si, P, S, Al, Mg), while XRF technology precisely determines high-content elements (Cr, Ni, Mo). The short measurement time suits smelting process control, significantly improving QC throughput.
Applications
- Smelting process control and metallurgy
- Alloy composition analysis
- Full-element analysis
- Harmful-element detection (RoHS, halogens)
What to ask about
The standard configuration includes an ultra-thin-window tube, a FAST-SDD detector, an optical-path enhancement system, automatic collimator and filter switching, automatic spectrum stabilization and a vacuum pump. Contact us to match a configuration to your production process.
The full technical specification and configuration will be provided in the datasheet PDF.
Datasheet (PDF) — coming soon