EDX-T30
Top-illumination XRF analyzer for measuring coating thickness — with a built-in multi-collimator, automatic filter switching, dual cameras and automatic 3D X/Y/Z movement.
- Top-illumination design for coating-thickness measurement
- Built-in multi-collimator and automatic filter switching
- Dual cameras — detail and a wide HD field of view
- Automatic 3D movement on X/Y/Z axes
- Measures flat, convex, corner and arc surfaces
- Over 30 years of XRF thickness-measurement experience
The EDX-T30 is a new top-illumination X-ray analyzer for measuring coating thickness, developed from more than thirty years of Skyray experience in XRF thickness measurement. It features an integrated multi-collimator, automatic filter switching and dual cameras that show both the detail of the measured spot and a high-resolution, wide-angle view of the measurement field. Automatic three-dimensional movement on the X/Y/Z axes enables measurement of flat, convex, corner and arc surfaces.
Applications
- Thickness measurement of electroplated coatings and functional layers
- Quality control in electroplating and electronics
- Samples with complex shapes
- Inspection and incoming-material laboratories
What to ask about
The multi-collimator and automatic filter switching let you match measurement conditions to different coatings, while dual cameras and 3D movement ease precise positioning on complex parts. Contact us to match a configuration to your coatings and shapes.
The full technical specification and configuration will be provided in the datasheet PDF.
Datasheet (PDF) — coming soon