EDX-V
XRF coating-thickness and composition analyzer with polycapillary X-ray optics — for efficient, accurate micro-area measurement of electronic parts, chip pins and wafers.
- Coating-thickness measurement and composition analysis
- Polycapillary X-ray optical system
- Micro-area measurement at the micron scale
- Electronic parts, chip pins and wafers
- High measurement efficiency and accuracy
- Dedicated to very small parts
The EDX-V is an X-ray coating-thickness and composition analyzer developed from more than thirty years of Skyray experience in XRF thickness measurement. It uses a polycapillary X-ray optical system, so it efficiently and accurately measures coating thickness and analyzes composition in micron-scale micro-areas — on electronic parts, integrated-circuit pins and wafer micro-areas.
Applications
- Coating-thickness measurement of tiny electronic parts
- Analysis of IC pins and wafer micro-areas
- Quality control in microelectronics
- Precision electroplating
What to ask about
Polycapillary X-ray optics focus the beam onto a very small area, enabling measurements where standard collimators are too large. Contact us to match a configuration to your micro-parts.
The full technical specification and configuration will be provided in the datasheet PDF.
Datasheet (PDF) — coming soon